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Precisely Picking Nanoparticles by a “Nano-Scalpel” for 360° Electron Tomography

Published online by Cambridge University Press:  14 September 2022

Xiaohui Huang ,
Yushu Tang ,
Christian Kübel Open the ORCID record for Christian Kübel [Opens in a new window]  and
Di Wang Open the ORCID record for Di Wang [Opens in a new window]
Xiaohui Huang
Affiliation:
Institute of Nanotechnology, Karlsruhe Institute of Technology, Hermann-von-Helmholtz-Platz 1, 76344 Eggenstein-Leopoldshafen, Germany Department of Materials and Earth Sciences, Technical University of Darmstadt, Alarich-Weiss-Straße 2, 64287 Darmstadt, Germany
Yushu Tang*
Affiliation:
Institute of Nanotechnology, Karlsruhe Institute of Technology, Hermann-von-Helmholtz-Platz 1, 76344 Eggenstein-Leopoldshafen, Germany
Christian Kübel
Affiliation:
Institute of Nanotechnology, Karlsruhe Institute of Technology, Hermann-von-Helmholtz-Platz 1, 76344 Eggenstein-Leopoldshafen, Germany Department of Materials and Earth Sciences, Technical University of Darmstadt, Alarich-Weiss-Straße 2, 64287 Darmstadt, Germany Karlsruhe Nano Micro Facility (KNMF), Karlsruhe Institute of Technology, Hermann-von-Helmholtz-Platz 1, 76344 Eggenstein-Leopoldshafen, Germany
Di Wang*
Affiliation:
Institute of Nanotechnology, Karlsruhe Institute of Technology, Hermann-von-Helmholtz-Platz 1, 76344 Eggenstein-Leopoldshafen, Germany Karlsruhe Nano Micro Facility (KNMF), Karlsruhe Institute of Technology, Hermann-von-Helmholtz-Platz 1, 76344 Eggenstein-Leopoldshafen, Germany
*
*Corresponding authors: Di Wang, E-mail: [email protected]; Yushu Tang, E-mail: [email protected]
*Corresponding authors: Di Wang, E-mail: [email protected]; Yushu Tang, E-mail: [email protected]
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Abstract

Electron tomography (ET) has gained increasing attention for the 3D characterization of nanoparticles. However, the missing wedge problem due to a limited tilt angle range is still the main challenge for accurate reconstruction in most experimental TEM setups. Advanced algorithms could in-paint or compensate to some extent the missing wedge artifacts, but cannot recover the missing structural information completely. 360° ET provides an option to solve this problem by tilting a needle-shaped specimen over the full tilt range and thus filling the missing information. However, sample preparation especially for fine powders to perform full-range ET is still challenging, thus limiting its application. In this work, we propose a new universal sample preparation method that enables the transfer of selected individual nanoparticle or a few separated nanoparticles by cutting a piece of carbon film supporting the specimen particles and mounting them onto the full-range tomography holder tip with the help of an easily prepared sharp tungsten tip. This method is demonstrated by 360° ET of Pt@TiO2 hollow cage catalyst showing high quality reconstruction without missing wedge.

Keywords

360° tiltingelectron tomographyFIBmissing wedgenanoparticlessample preparation
Type
Software and Instrumentation
Information
Microscopy and Microanalysis , Volume 28 , Issue 6 , December 2022 , pp. 1981 - 1988
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Copyright
Copyright © The Author(s), 2022. Published by Cambridge University Press on behalf of the Microscopy Society of America

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