Hostname: page-component-cd9895bd7-gxg78 Total loading time: 0 Render date: 2025-01-01T01:02:12.903Z Has data issue: false hasContentIssue false
  • English
  • Français

Practical Considerations for Ultrashort Electron Pulse Characterization in Ultrafast Transmission Electron Microscopy

Published online by Cambridge University Press:  27 August 2014

Dayne Plemmons  and
David J. Flannigan
Dayne Plemmons
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN, 55455, USA
David J. Flannigan
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN, 55455, USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1588 - 1589
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Flannigan, D. J. and Zewail, A. H. Acc. Chem. Res. 45 (2012), 1828.Google Scholar
[2] Weingartshofer, A., Holmes, J. K., Caudle, G., Clarke, E. M., Krüger, H. Phys. Rev. Lett. 39 (1977), 269.Google Scholar
[3] Saathoff, G., Miaja-Avila, L., Aeschlimann, M., Murnane, M. M. and Kapteyn, H. C. Phys. Rev. A. 77 (2008), 022903.Google Scholar
[4] Barwick, B., Flannigan, D. J. and Zewail, A. H. Nature 462 (2009), 902.Google Scholar
[5] Park, S. T., Kwon, O.-H. and Zewail, A. H. New J. Phys. 14 (2012), 053046.Google Scholar
[6] Park, S. T., Lin, M. and Zewail, A. H. New J. Phys. 12 (2010), 123028.Google Scholar
[7] This work is partially supported by 3M through a Non-tenured Faculty Award. Acknowledgment is made to the Donors of the American Chemical Society Petroleum Research Fund for partial support of this research.Google Scholar