Hostname: page-component-586b7cd67f-tf8b9 Total loading time: 0 Render date: 2024-11-28T01:39:13.704Z Has data issue: false hasContentIssue false
  • English
  • Français

Possibilities And Examples For Remote Microscopy Including Digital Image Acquisition, Transfer, and Archiving

Published online by Cambridge University Press:  02 July 2020

I. Daberkow  and
M. Schierjott
I. Daberkow
Affiliation:
Soft Imaging System, Hammer Strasse 89, D-48153, Muenster, Germany
M. Schierjott
Affiliation:
Soft Imaging System, Hammer Strasse 89, D-48153, Muenster, Germany
Get access

Extract

Recent developments promise the possibility to externally control every aspect of microscopes through a computer interface. In combination with high-resolution cameras and feedback to the microscope, this can be leveraged to create highly automatic routines, e.g., to remotely correct astigmatism. Together with the development of fast computer networks this creates a new branch of microscopy, the so-called “telemicroscopy”. The goal of telemicroscopy is the control of a microscope over a large distance including the transfer of images with an acceptable repetition rate. A big advantage for electron microscopy in particular is the possibility of having access to expensive and well-equipped microscopes. In the field of light microscopy the branch “telemedicine” was created, meaning the “virtual” presence of a colleague or specialist for discussion or diagnosis.

Using transmission electron microscopy as an example, the history and special requirements for automation and telemicroscopy will be discussed. In the late 80's the first TEM with a remote control was revealed. Shortly thereafter, first automatic functions for defocus control and astigmatism correction were developed using a video camera as electronic image converter.

Type
Advances in Remote Microscopy, Instrument Automation and Data Storage
Information
Microscopy and Microanalysis , Volume 4 , Issue S2: Proceedings: Microscopy & Microanalysis '98, Microscopy Society of America 56th Annual Meeting, Microbeam Analysis Society 32nd Annual Meeting, Atlanta, Georgia July 12-16, 1998 , July 1998 , pp. 2 - 3
Copyright
Copyright © Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

References:

1.Koster, A.J. and de Ruijter, W.J., Ultramicroscopy 40 (1992) 89.CrossRefGoogle Scholar
2.Daberkow, I. et al., Ultramicroscopy 38 (1991) 215.CrossRefGoogle Scholar
3.Kujawa, S. and Krahl, D., Ultramicroscopy 46 (1992) 395.CrossRefGoogle Scholar
4.Krivanek, O.L. and Mooney, P.E., Ultramicroscopy 49 (1992) 95.CrossRefGoogle Scholar
5.Ishizuka, K., Ultramicroscopy 55 (1994) 407.CrossRefGoogle Scholar
6.Krivanek, O.L., Ultramicroscopy 55 (1994) 419.CrossRefGoogle Scholar
7.Daberkow, et al., Philips Electron Optics Bulletin 134 (1996) 27.Google Scholar
8.Fan, G.Y. et al., Ultramicroscopy 52 (1993) 499.CrossRefGoogle Scholar
9.Ellisman, M.H., Proc. 53rd Ann MSA Meeting (1995) 66.CrossRefGoogle Scholar
10.Parvin, B. et al., Proc. 53rd Ann MSA Meeting (1995) 82.CrossRefGoogle Scholar
11.Voelkl, E. et al., Proc. 53rd Ann MSA Meeting (1995) 22.Google Scholar
12.Zaluzec, N.J., Proc. 53rd Ann MSA Meeting (1995) 14.CrossRefGoogle Scholar
13.Voelkl, E. et al., SCANNING Vol. 19 (1997) 286.CrossRefGoogle Scholar
14.Tanaka, M. and Buescher, P., Proc. Ann. Meeting of SFμ in Nancy (1997).Google Scholar