Hostname: page-component-586b7cd67f-2brh9 Total loading time: 0 Render date: 2024-11-24T18:48:30.853Z Has data issue: false hasContentIssue false
  • English
  • Français

A Point Projection Microscope for Electron Interferometry in the Reflection Mode

Published online by Cambridge University Press:  16 July 2003

B.G. Frost ,
A. Thesen  and
D.C. Joy
B.G. Frost
Affiliation:
University of Tennessee, M407 Walters Life Sci, Knoxville, TN 37996-0840
A. Thesen
Affiliation:
University of Tennessee, M407 Walters Life Sci, Knoxville, TN 37996-0840
D.C. Joy
Affiliation:
University of Tennessee, M407 Walters Life Sci, Knoxville, TN 37996-0840

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 966 - 967
Copyright
Copyright © Microscopy Society of America 2003