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Plasmon Energy Mapping in Aluminum and Indium with Sub-Nanometer Resolution

Published online by Cambridge University Press:  04 August 2017

Brian Zutter ,
Matthew Mecklenburg  and
B. C. Regan
Brian Zutter
Affiliation:
Department of Physics and Astronomy & California NanoSystems Institute, University of California, Los Angeles, CA, USA
Matthew Mecklenburg
Affiliation:
Center for Electron Microscopy and Microanalysis, University of Southern California, Los Angeles, CA, USA
B. C. Regan
Affiliation:
Department of Physics and Astronomy & California NanoSystems Institute, University of California, Los Angeles, CA, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 378 - 379
Copyright
© Microscopy Society of America 2017 

References

[1] Mecklenburg, M, et al, Science 347 2015). p. 629–632.CrossRefGoogle Scholar
[2] Egerton, R Reports on Progress in Physics 72 2009). p. 25.CrossRefGoogle Scholar
[3] Schattschneider, P "Fundamentals of Inelastic Electron Scattering". Springer-Verlag. p. 118.Google Scholar
[4] This work was supported by FAME, one of six centers of STARnet, a Semiconductor Research Corporation program sponsored by MARCO and DARPA, by National Science Foundation (NSF) award DMR-1611036, and by NSF STC award DMR-1548924. Data presented were acquired using a Grand ARM at the JEOL factory in Tokyo, Japan.Google Scholar