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Physics-Based Image Reconstruction of SiC Grain Boundaries

Published online by Cambridge University Press:  04 August 2017

Amirkoushyar Ziabari ,
Charles A. Bouman ,
Jeffrey M. Rickman  and
Jeff. P. Simmons
Amirkoushyar Ziabari
Affiliation:
Electrical and Computer Engineering (ECE), Purdue University, West Lafayette, IN, USA.
Charles A. Bouman
Affiliation:
Electrical and Computer Engineering (ECE), Purdue University, West Lafayette, IN, USA.
Jeffrey M. Rickman
Affiliation:
Department of Material Science and Engineering, Lehigh University, Bethlehem, PA, USA.
Jeff. P. Simmons
Affiliation:
Air Force Research Laboratory, Wright-Patterson AFB, OH, USA.

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 188 - 189
Copyright
© Microscopy Society of America 2017 

References

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