Hostname: page-component-586b7cd67f-l7hp2 Total loading time: 0 Render date: 2024-11-24T17:25:56.023Z Has data issue: false hasContentIssue false
  • English
  • Français

Phase Imaging beyond the Diffraction Limit with Electron Ptychography

Published online by Cambridge University Press:  05 August 2019

David A. Muller ,
Zhen Chen ,
Yi Jiang ,
Michal Odstrcil ,
Yimo Han ,
Prafull Purohit ,
Mark W. Tate ,
Sol M. Gruner  and
Veit Elser
David A. Muller*
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853, USA Kavli Institute at Cornell for Nanoscale Science, Ithaca, NY 14853, USA
Zhen Chen
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853, USA
Yi Jiang
Affiliation:
Department of Physics, Cornell University, Ithaca, NY 14853, USA
Michal Odstrcil
Affiliation:
Paul Scherrer Institut, CH-5232 Villigen PSI, Switzerland
Yimo Han
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853, USA
Prafull Purohit
Affiliation:
Department of Physics, Cornell University, Ithaca, NY 14853, USA
Mark W. Tate
Affiliation:
Department of Physics, Cornell University, Ithaca, NY 14853, USA
Sol M. Gruner
Affiliation:
Department of Physics, Cornell University, Ithaca, NY 14853, USA Kavli Institute at Cornell for Nanoscale Science, Ithaca, NY 14853, USA
Veit Elser
Affiliation:
Department of Physics, Cornell University, Ithaca, NY 14853, USA
*
*Corresponding author: [email protected]

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Advances in Phase Retrieval Microscopy
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 6 - 7
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Tate, MW, et al. , Microscopy and Microanalysis 22 (2016), p. 237.Google Scholar
[2]Maiden, A, et al. , Ultramicroscopy 109 (2009), p. 1256.Google Scholar
[3]Jiang, Y., et al. , Nature 559, (2018), p343.Google Scholar
[4]Allen, C. S., et al. ,. Microscopy and Microanalysis, 24(S1), (2018) p. 186–187.Google Scholar
[5]We thank Jiwoong Park, Saien Xie, Hui Gao, Ming-Hui Chiu, and Lain-Jong Li for samples. Research supported by US National Science Foundation (grants DMR-1539918, DMR-1429155, DMR-1719875) & US Department of Energy Basic Energy Sciences (DE-SC0005827).Google Scholar