Hostname: page-component-586b7cd67f-t8hqh Total loading time: 0 Render date: 2024-11-28T10:40:36.906Z Has data issue: false hasContentIssue false
  • English
  • Français

Phase Imaging: A Compressive Sensing Approach

Published online by Cambridge University Press:  04 August 2017

Sebastian Schneider ,
Andrew Stevens ,
Nigel D. Browning ,
Darius Pohl ,
Kornelius Nielsch  and
Bernd Rellinghaus
Sebastian Schneider
Affiliation:
IFW Dresden, Institute for Metallic Materials, Dresden, Germany TU Dresden, Institute of Solid State Physics, Dresden, Germany
Andrew Stevens
Affiliation:
Pacific Northwest National Laboratory, Richland, Washington, USA Duke University, Electrical and Computer Engineering, Durham, North Carolina, USA
Nigel D. Browning
Affiliation:
Pacific Northwest National Laboratory, Richland, Washington, USA University of Washington, Materials Science and Engineering, Seattle, Washington, USA
Darius Pohl
Affiliation:
IFW Dresden, Institute for Metallic Materials, Dresden, Germany
Kornelius Nielsch
Affiliation:
IFW Dresden, Institute for Metallic Materials, Dresden, Germany TU Dresden, Institute of Materials Science, Dresden, Germany
Bernd Rellinghaus
Affiliation:
IFW Dresden, Institute for Metallic Materials, Dresden, Germany

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 94 - 95
Copyright
© Microscopy Society of America 2017 

References

[1] Pauli, W. in "Die allgemeinen Prinzipien der Wellenmechanik", ed. H Geiger and W Scheel, (Julius Springer, Berlin).Google Scholar
[2] Tonomura, A. Rev. Mod. Phys 59 1987). p. 639.Google Scholar
[3] Miao, J., et al, Nature 400 1999). p. 342.Google Scholar
[4] Lichte, H., et al, Annu. Rev. Mater. Res 37 2007). p. 539.Google Scholar
[5] Yamasaki, J., et al, Appl. Phys. Lett 101 2012 234105.CrossRefGoogle Scholar
[6] Schniter, P. & Rangan, S. IEEE Trans. on. Signal Proc 63(4 2015). p. 1043.Google Scholar
[7] Supported by the Chemical Imaging, Signature Discovery, and Analytics in Motion initiatives at PNNL. PNNL is operated by Battelle Memorial Inst. for the US DOE; contract DE-AC05-76RL01830.Google Scholar