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Phase Identification of III-N Thin Films Grown by Molecular Beam Epitaxy and Migration Enhanced Epitaxy using Precession Electron Diffraction

Published online by Cambridge University Press:  04 August 2017

Eduardo Ortega ,
Y. L. Casallas-Moreno ,
M. Lopez-Lopez  and
Arturo Ponce
Eduardo Ortega
Affiliation:
Department of Physics and Astronomy, University of Texas at San Antonio, San Antonio, Texas 78249, United States
Y. L. Casallas-Moreno
Affiliation:
Escuela Superior de Fisica y Matematicas, Instituto Politecnico Nacional (IPN), Ciudad de Mexico 07738, Mexico
M. Lopez-Lopez
Affiliation:
Physics Department, Centro de Investigacion y de Estudios Avanzados del IPN, Ciudad de Mexico 07360, Mexico.
Arturo Ponce
Affiliation:
Department of Physics and Astronomy, University of Texas at San Antonio, San Antonio, Texas 78249, United States

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1484 - 1485
Copyright
© Microscopy Society of America 2017 

References

[1] Nakamura, T., et al, Phys. Stat. Sol. (b) 243(7 2006 1451–1455.Google Scholar
[2] Casallas-Moreno, Y. L., et al, J. Appl. Phys 2013 113, 1.Google Scholar
[3] Ruiz-Zepeda, F., et al, Microsc. Res. Tech 2014 77, 980.Google Scholar
[4] The work was supported by SENER-CONACYT Project number 151076 and by the National Institute on Minority Health and Health Disparities of the NIH grant G12MD007591.Google Scholar