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Phase determination from atomically resolved images: physics-constrained deep data analysis through an unmixing approach

Published online by Cambridge University Press:  25 July 2016

R. K. Vasudevan ,
M. Ziatdinov ,
S. Jesse  and
S. V. Kalinin
R. K. Vasudevan
Affiliation:
Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge TN 37831USA Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge TN 37831USA
M. Ziatdinov
Affiliation:
Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge TN 37831USA Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge TN 37831USA
S. Jesse
Affiliation:
Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge TN 37831USA Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge TN 37831USA
S. V. Kalinin
Affiliation:
Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge TN 37831USA Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge TN 37831USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1452 - 1453
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Vasudevan, RK, Tselev, A, Baddorf, AP, Kalinin, SV & Jesse, S Appl. Phys. Lett 106 (2015). p. 091601.Google Scholar
[2] Winter, ME SPIE’s International Symposium on Optical Science, Engineering, and Instrumentation. International Society for Optics and Photonics 1999). p. 266.Google Scholar
[3] This research was sponsored by the Division of Materials Sciences and Engineering, BES, DOE (RKV, MZ, SVK). Research was conducted at the Center for Nanophase Materials Sciences, which also provided support (SJ) and is a DOE Office of Science User Facility.Google Scholar