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Periodic Artifact Reduction in Fourier Transforms of Full Field Atomic Resolution Images

Published online by Cambridge University Press:  23 September 2015

Robert Hovden ,
Yi Jiang ,
Huolin L. Xin  and
Lena F. Kourkoutis
Robert Hovden
Affiliation:
School of Applied & Engineeri
Yi Jiang
Affiliation:
Department of Physics, Cornell University, Ithaca, NY, USA.
Huolin L. Xin
Affiliation:
Center for Function Nanomaterials, Brookhaven National Laboratory, Upton, NY, USA.
Lena F. Kourkoutis
Affiliation:
School of Applied & Engineeri Kavli Institute at Cornell for Nanoscale Science, Ithaca, NY, USA.

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 2253 - 2254
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Harris, F.J., Proc IEEE 66, 51–83 (1978).Google Scholar
[2] Hovden, R., et. al, Microsc. Microanal., doi: 10.1017/S1431927614014639 (2015). [3] L. Moisan, J. Math Imaging Visualization 39, 161–179 (2013).Google Scholar
[4] This work used the CCMR, EM facility supported by NSF MRSEC program ((DMR-1120296).Google Scholar