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Performance of Ultra-Violet Laser Pulsing with a Wire-Geometry, Moderately Focused Atom Probe System (EIKOS)

Published online by Cambridge University Press:  05 August 2019

Robert M. Ulfig ,
Joseph Bunton ,
Dan Lenz ,
Yimeng Chen ,
Katherine P. Rice ,
Ty J. Prosa ,
Peter H. Clifton  and
David J. Larson
Robert M. Ulfig*
Affiliation:
CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI 53711USA.
Joseph Bunton
Affiliation:
CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI 53711USA.
Dan Lenz
Affiliation:
CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI 53711USA.
Yimeng Chen
Affiliation:
CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI 53711USA.
Katherine P. Rice
Affiliation:
CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI 53711USA.
Ty J. Prosa
Affiliation:
CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI 53711USA.
Peter H. Clifton
Affiliation:
CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI 53711USA.
David J. Larson
Affiliation:
CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI 53711USA.
*
*Corresponding author: [email protected]

Abstract

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Type
New Frontiers in Atom Probe Tomography Applications
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 2550 - 2551
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Larson, D.J., et al. , “Local Electrode Atom Probe Tomography”, (Springer, New York) (2013).Google Scholar
[2]Larson, D.J., et al. , JOM 70 (2018), p. 1776.Google Scholar
[3]Bunton, J., et al. , Microscopy and Microanalysis 13 (2007), p. 418.Google Scholar
[4]Melmed, A.J., J.V.S.T. B9 (1991), p. 601.Google Scholar
[5]Thompson, K., et al. , Ultramicroscopy 107 (2007), p. 131.Google Scholar
[6]Currie, L.A., Analytical Chemistry 40 (1968), p. 586.Google Scholar
[7]Reinhard, D.A., et al. , Microscopy and Microanalysis 21 (2015), p. 851.Google Scholar