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Performance Data of a New 2048 X 2048 Pixel Slow-Scan CCD Camera For TEM

Published online by Cambridge University Press:  02 July 2020

S.A. Hiller ,
B. Kabius ,
W. Probst ,
H. Tröster ,
M. Trendelenburg ,
C. Crucifix  and
A. Tröndle
S.A. Hiller
Affiliation:
LEO Elektronenmikroskopie GmbH, Carl-Zeiss-Str. 56, D-73447 Oberkochen / Germany
B. Kabius
Affiliation:
LEO Elektronenmikroskopie GmbH, Carl-Zeiss-Str. 56, D-73447 Oberkochen / Germany
W. Probst
Affiliation:
LEO Elektronenmikroskopie GmbH, Carl-Zeiss-Str. 56, D-73447 Oberkochen / Germany
H. Tröster
Affiliation:
LEO Elektronenmikroskopie GmbH, Carl-Zeiss-Str. 56, D-73447 Oberkochen / Germany
M. Trendelenburg
Affiliation:
LEO Elektronenmikroskopie GmbH, Carl-Zeiss-Str. 56, D-73447 Oberkochen / Germany
C. Crucifix
Affiliation:
Biomedical Structure Analysis Group (0195) German Cancer Research Center (DKFZ); Im Neuenheimer Feld 280, D-69120 Heidelberg / Germany
A. Tröndle
Affiliation:
PROSCAN elektronische Systeme GmbH, Lechstr. 40, D-86937 Scheuring / Germany
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Extract

Excellent linearity and high sensitivity have made SSCs the ideal image detector for almost every TEM application. Their ability to make high quality digital images available within fraction of seconds for further evaluation and processing in a PC, have made them a non-dispensable accessory for any modern TEM. However, despite their excellent characteristics, SSCs provide a restricted number of individual image points in respect to a negative, what is considered to be the main disadvantage of this detector. To compensate for this, CCDs with 2048x2048 pixel are available since some time. SSCs using these 2kx2k CCD arrays not only provide 4 times the pixel number but also offer a lot more options people have waiting for: e. g. highly resolved low-dose or ESI images with significantly improved signal to noise ratio, or higher resolved images for diffraction analysis and holographic reconstruction.

Type
New Detectors—Benefits and Drawbacks
Information
Microscopy and Microanalysis , Volume 6 , Issue S2: Proceedings: Microscopy & Microanalysis 2000, Microscopy Society of America 58th Annual Meeting, Microbeam Analysis Society 34th Annual Meeting, Microscopical Society of Canada/Societe de Microscopie de Canada 27th Annual Meeting, Philadelphia, Pennsylvania August 13-17, 2000 , August 2000 , pp. 732 - 733
Copyright
Copyright © Microscopy Society of America

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References

References:

[1]Krivanek, O.L. and Mooney, P.E., Applications of slow-scan CCD cameras in transmission electron microscopy, Ultramieroseopy 49 (1993), 95–108.Google Scholar
[2]Hiller, S.A., et al., New SSC Cameras with frame/interline CCD architecture avoid TEM shutter control, provide excellent image quality and can be easily retrofitted, Proc. MSA (1999).CrossRefGoogle Scholar
[3]Frank, J., A practical resolution criterion in optics and electron microscopy, Optik 43 (1975), No. 1,25–34.Google Scholar