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Performance and Application of Chromatic/Spherical Aberration-Corrected 30 kV Transmission Electron Microscope

Published online by Cambridge University Press:  08 April 2017

T Sasaki ,
H Sawada ,
F Hosokawa ,
Y Shimizu ,
T Nakamichi ,
S Yuasa ,
M Kawazoe ,
T Kaneyama ,
Y Kondo  and
K Kimoto
...Show all authors
T Sasaki
Affiliation:
JEOL Ltd, Japan
H Sawada
Affiliation:
JEOL Ltd, Japan
F Hosokawa
Affiliation:
JEOL Ltd, Japan
Y Shimizu
Affiliation:
JEOL Ltd, Japan
T Nakamichi
Affiliation:
JEOL Ltd, Japan
S Yuasa
Affiliation:
JEOL Ltd, Japan
M Kawazoe
Affiliation:
JEOL Ltd, Japan
T Kaneyama
Affiliation:
JEOL Ltd, Japan
Y Kondo
Affiliation:
JEOL Ltd, Japan
K Kimoto
Affiliation:
National Institute for Materials Science, Japan
K Suenaga
Affiliation:
Advanced Industrial Science and Technology, Japan

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 1530 - 1531
Copyright
Copyright © Microscopy Society of America 2011