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Peculiar Plasmon Peak Position in Electron Energy Loss Spectrum of Hexagonal Boron Nitride/Graphene Double Layer

Published online by Cambridge University Press:  23 September 2015

Nicholas Cross ,
Lei Liu ,
Ali Mohsin ,
Gong Gu  and
Gerd Duscher
Nicholas Cross
Affiliation:
Department of Materials Science and Engineering, the University of Tennessee, Knoxville, TN 37996, United States
Lei Liu
Affiliation:
Department of Electrical Engineering and Computer Science, the University of Tennessee, Knoxville,TN 37996, United States
Ali Mohsin
Affiliation:
Department of Electrical Engineering and Computer Science, the University of Tennessee, Knoxville,TN 37996, United States
Gong Gu
Affiliation:
Department of Electrical Engineering and Computer Science, the University of Tennessee, Knoxville,TN 37996, United States
Gerd Duscher
Affiliation:
Department of Materials Science and Engineering, the University of Tennessee, Knoxville, TN 37996, United States Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831,United States

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 985 - 986
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Geim, A. & Grigorieva, I., Nature 499 (2013). p. 419.CrossRefGoogle Scholar
[2] Liu, L., Park, J. & Siegel, D., Science 343 (2014). p. 163.Google Scholar
[3] Eberlein, T., Bangert, U. & Nair, R., Physical Review B 77 (2008). p. 233406.Google Scholar
[4] Arenal, R., Stephan, O. & Kociak, M., Physcial Review Letters 95 (2005). p. 127601.CrossRefGoogle Scholar
[5] We acknowledge financial support by NSF (DMR-1410940). The atomic resolution characterization of this research was conducted at the Center for Nanophase Materials Sciences (CNMS2014-339), which is a DOE Office of Science User Facility..Google Scholar