Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by Crossref.
Eggert, F
2019.
Complementary Standardless Quantitative Methods with EDS.
Microscopy and Microanalysis,
Vol. 25,
Issue. S2,
p.
560.
Eggert, Frank
2020.
Effect of the Silicon Drift Detector on EDAX Standardless Quant Methods.
Microscopy Today,
Vol. 28,
Issue. 2,
p.
34.
Llovet, Xavier
Moy, Aurélien
Pinard, Philippe T.
and
Fournelle, John H.
2021.
Reprint of: Electron probe microanalysis: A review of recent developments and applications in materials science and engineering.
Progress in Materials Science,
Vol. 120,
Issue. ,
p.
100818.
Llovet, Xavier
Moy, Aurélien
Pinard, Philippe T.
and
Fournelle, John H.
2021.
Electron probe microanalysis: A review of recent developments and applications in materials science and engineering.
Progress in Materials Science,
Vol. 116,
Issue. ,
p.
100673.
Karmanov, Nikolay Semenovich
Kanakin, Sergei Vasilievich
and
Lavrent'ev, Yuri Grigorievich
2022.
Integral bremsstrahlung energy as an inbuilt standard in energy‐dispersive electron probe microanalysis.
X-Ray Spectrometry,
Vol. 51,
Issue. 5-6,
p.
444.
Pukhov, D. E.
2023.
A Comparison of the Peak-to-Background Method and an Empirical Correction of the Results in the Energy-Dispersive Electron Probe Quantitative Analysis of Powder Materials.
Журнал аналитической химии,
Vol. 78,
Issue. 5,
p.
469.
Pukhov, D. E.
2023.
A Comparison of the Peak-to-Background Method and an Empirical Correction of the Results in the Energy-Dispersive Electron Probe Quantitative Analysis of Powder Materials.
Journal of Analytical Chemistry,
Vol. 78,
Issue. 5,
p.
652.