Hostname: page-component-78c5997874-ndw9j Total loading time: 0 Render date: 2024-11-02T21:58:15.799Z Has data issue: false hasContentIssue false
  • English
  • Français

Parallel Transmission Electron and Atomic Force Microscopy: Direct and Repetitive Correlation of TEM and AFM images by a Novel Sample Holder

Published online by Cambridge University Press:  01 August 2002

Alvin C. Lin  and
M. Cynthia Goh
Alvin C. Lin
Affiliation:
Department of Chemistry, University of Toronto, Toronto, ON, M5S 3H6
M. Cynthia Goh
Affiliation:
Department of Chemistry, University of Toronto, Toronto, ON, M5S 3H6

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 1026 - 1027
Copyright
Copyright © Microscopy Society of America 2002