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Parallel Ion Electron Spectrometry (PIES): A New Paradigm for High-Resolution High-Sensitivity Characterization based on integrated TEM-SIMS

Published online by Cambridge University Press:  23 September 2015

S. Eswara Moorthy ,
D. Dowsett ,
L. Yedra  and
T. Wirtz

Abstract

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Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1859 - 1860
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

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