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Parallel Ion Electron Spectrometry (PIES): A New Paradigm for High-Resolution High-Sensitivity Characterization based on integrated TEM-SIMS

Published online by Cambridge University Press:  23 September 2015

S. Eswara Moorthy ,
D. Dowsett ,
L. Yedra  and
T. Wirtz

Abstract

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Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1859 - 1860
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Reimer, L. & Kohl, H., Transmission Electron Microscopy: physics of image formation. Springer, New York, 2008).Google Scholar
[2] Egerton, R. F., Electron Energy-Loss Spectroscopy in the Electron Microscope, (3rd edition), (Springer, New York, 2011).CrossRefGoogle Scholar
[3] McPhail, D. S., J. Mater. Sci. 41 (2006) 873.Google Scholar
[4] Ngo, K. Q., et al, Surf. Sci. 606 (2012) 1244.Google Scholar
[5] Philipp, P., etal, Int. J. Mass. Spectrom. 253 (2006) 71.Google Scholar