Hostname: page-component-586b7cd67f-t7czq Total loading time: 0 Render date: 2024-11-27T10:19:51.599Z Has data issue: false hasContentIssue false
  • English
  • Français

Optimizing the Recognition of Surface Crystallography

Published online by Cambridge University Press:  28 September 2015

Ludψk Frank ,
Filip Mika  and
Ilona Müllerová
Ludψk Frank
Affiliation:
Institute of Scientific Instruments of the ASCR, v. v. i., Královopolská 147, 612 64 Brno, Czech Republic
Filip Mika
Affiliation:
Institute of Scientific Instruments of the ASCR, v. v. i., Královopolská 147, 612 64 Brno, Czech Republic
Ilona Müllerová
Affiliation:
Institute of Scientific Instruments of the ASCR, v. v. i., Královopolská 147, 612 64 Brno, Czech Republic

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Surface Physics Instrumentation
Information
Microscopy and Microanalysis , Volume 21 , Supplement S4: Proceedings Ninth International Conference on Charged Particle Optics , June 2015 , pp. 124 - 129
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1]Venables, JA & Harland, CJ, Phil. Mag 27 (1973). p 1193.CrossRefGoogle Scholar
[2]Müllerová, I & Frank, L, Adv. Imaging and Electron Phys 128 (2003), p 309.CrossRefGoogle Scholar
[3]Kieft, E & Bosch, E, J. Phys. D - Appl. Phys 41 (2008). no. 215310.CrossRefGoogle Scholar
[4]Reimer, L in “Scanning electron microscopy, physics of image formation and microanalysis“, (Springer, Berlin) Chapt. 9.Google Scholar
[5] Study supported by the project TE01020118 of the TACR and by MEYS CR (LO1212). Thanks are due to Mr. Jiff Sykora for his assistance in experiments.Google Scholar