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Optimized Solutions for the Arrangement of Digital Imaging Detectors

Published online by Cambridge University Press:  23 September 2015

T. Hashimoto ,
J. F. Mancuso ,
K. Nakano ,
E. Nakazawa ,
L. Blubaugh  and
B. L. Armbruster
T. Hashimoto
Affiliation:
Hitachi High-Technologies Corporation, Ibaraki 312-8504, Japan
J. F. Mancuso
Affiliation:
Advanced Microscopy Techniques Corporation, 242 W. Cummings Park, Woburn MA, USA
K. Nakano
Affiliation:
Hitachi High-Technologies Corporation, Kanagawa 213-0012, Japan
E. Nakazawa
Affiliation:
Hitachi High-Technologies Corporation, Ibaraki 312-8504, Japan
L. Blubaugh
Affiliation:
Hitachi High Technologies America, Inc., 22610 Gateway Center Dr., Clarksburg MDUSA
B. L. Armbruster
Affiliation:
Hitachi High Technologies America, Inc., 5960 Inglewood Dr., Pleasanton CA, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 149 - 150
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Tanaka, H., et al., Proc. 67th Annual Meeting of the Japanese Society of Microscopy, 16Apm_I1-3 (2011) p.8.Google Scholar
[2] Hashimoto, T., et al., Proceedings M&M2012, Phoenix (2012) p. 1280.Google Scholar
[3] Janssen, W.G., Hanson, H.H. & Armbruster, B.L. Proceedings M&M2014, Hartford (2014) p. 1104.Google Scholar