Hostname: page-component-cd9895bd7-lnqnp Total loading time: 0 Render date: 2024-12-25T19:46:19.716Z Has data issue: false hasContentIssue false
  • English
  • Français

Optimization of Signal Detection in Scintillation Secondary Electron Detector for ESEM and SEM

Published online by Cambridge University Press:  27 August 2014

Pavel Čudek ,
Josef Jirák  and
Vilém Neděla
Pavel Čudek
Affiliation:
Department of Electrotechnology, Brno University of Technology, Brno, Czech Republic
Josef Jirák
Affiliation:
Department of Electrotechnology, Brno University of Technology, Brno, Czech Republic Institute of Scientific Instruments of ASCR, Brno, Czech Republic
Vilém Neděla
Affiliation:
Institute of Scientific Instruments of ASCR, Brno, Czech Republic

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 40 - 41
Copyright
Copyright © Microscopy Society of America 2014 

References

References:

[1] Jirák, J, et al Journal of Microscopy 239 (2010),p. 233.Google Scholar
[2] Jirák, J, et al Microscopy and Microanalysis (2012)p. 1266.Google Scholar
[3] Jirák, J, et al Microscopy and Microanalysis (2011)p. 922.Google Scholar
[4] This work was supported by the EU project No. CZ.1.07/2.3.00/20.0103 and by the Grant Agency of the Czech Republic: grant No. GA 14-22777S.Google Scholar