Hostname: page-component-78c5997874-94fs2 Total loading time: 0 Render date: 2024-11-10T02:33:45.084Z Has data issue: false hasContentIssue false

Operating Conditions For Quantitative X-Ray Analysis In The Environmental SEM

Published online by Cambridge University Press:  02 July 2020

R. A. Carlton
Affiliation:
Pharmaceutical Research and Development, Rhone-Poulenc Rorer, Collegeville, PA, 19426
C. E. Lyman
Affiliation:
Department of Materials Science and Engineering, Lehigh University, Bethlehem, PA, 18015
J. E. Roberts
Affiliation:
Department of Chemistry, Lehigh University, Bethlehem, PA, 18015
Get access

Extract

Standard Reference Material (SRM) 482 of the National Institute of Standards and Technology is a set of 6 gold/copper wires, ranging in concentration from 0 to 100% Cu in 20% steps, intended for calibration studies of electron beam microanalyzers. This is an appropriate standard to test the accuracy of energy dispersive x-ray spectrometry (EDS) in the Environmental Scanning Electron Microscope (ESEM). While the presence of the gas in the sample chamber gives the ESEM its unique capabilities, it also is the source of complications to x-ray spectrometry. The gas can spread the primary electron beam into a wide skirt of electrons with the consequent production of x-rays many micrometers from the target location of the beam. In spite of the difficulties, at least two methods have been proposed to correct high pressure data to that expected at low pressures.

Type
New Trends in Scanning Electron Microscopy and Microanalysis
Copyright
Copyright © Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1.Heinrich, K. F. et al., NBS Special Publication 260-28 (1971).Google Scholar
2.Danilatos, G. D., Microscopy Research and Technique 25 (1993) 354.CrossRefGoogle Scholar
3.Bache, I. C. et al., Microscopy and Microanalysis 3: Suppl. 2 (1997) 1211.CrossRefGoogle Scholar
4.Doehne, E., Scanning, 18 (1996) 164.Google Scholar
5.Bilde-Sorenson, J. B. and Appel, C. C.in Abstracts of the Scandinavian Society for Electron Microscopy, Svenskt Tryck I Goteburg AB, Sweden (1997) 12.Google Scholar