Hostname: page-component-586b7cd67f-t7fkt Total loading time: 0 Render date: 2024-11-28T22:34:14.576Z Has data issue: false hasContentIssue false

On-the-Fly Image Quality Evaluation for Single-Particle Analysis Cryo-Electron Microscopy

Published online by Cambridge University Press:  04 August 2017

Lingbo Yu
Affiliation:
Thermo Fisher Scientific, Materials and Structural Analysis, Eindhoven, the Netherlands
Erik Franken
Affiliation:
Thermo Fisher Scientific, Materials and Structural Analysis, Eindhoven, the Netherlands
Andreas Voigt
Affiliation:
Thermo Fisher Scientific, Materials and Structural Analysis, Eindhoven, the Netherlands
Fanis Grollios
Affiliation:
Thermo Fisher Scientific, Materials and Structural Analysis, Eindhoven, the Netherlands
Peter Tiemeijer
Affiliation:
Thermo Fisher Scientific, Materials and Structural Analysis, Eindhoven, the Netherlands
Steve Reyntjens
Affiliation:
Thermo Fisher Scientific, Materials and Structural Analysis, Eindhoven, the Netherlands

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Copyright
© Microscopy Society of America 2017 

References

[1] Danev, R, Tegunov, D & Baumeister, W eLife 6 2017.Google Scholar
[2] Zhang, K Journal of Structural Biology 193 2016). p. 112.CrossRefGoogle Scholar
[3] Rohou, A & Grigorieff, N Journal of Structural Biology 192 2015). p. 216221.Google Scholar