Hostname: page-component-cd9895bd7-gvvz8 Total loading time: 0 Render date: 2024-12-26T19:52:07.796Z Has data issue: false hasContentIssue false
  • English
  • Français

On the Simulation of True EDS X-Ray Spectra

Published online by Cambridge University Press:  01 August 2002

Raynald Gauvin  and
Eric Lifshin
Raynald Gauvin
Affiliation:
Department of Mining, Metals and Materials Engineering, McGill University, Montréal, Québec, Canada, H3A 2B2
Eric Lifshin
Affiliation:
Albany Institute for Materials, CESTM, 251 Fuller Road, Albany, NY, 12301

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 430 - 431
Copyright
Copyright © Microscopy Society of America 2002