Hostname: page-component-78c5997874-lj6df Total loading time: 0 Render date: 2024-11-03T05:16:33.168Z Has data issue: false hasContentIssue false

On the Influence of Specimen Thickness in TEM Images of Super-Conducting Vortices: II

Published online by Cambridge University Press:  02 July 2020

J. Bonevich
Affiliation:
National Institute of Standards & Technology, Metallurgy Division, Gaithersburg, MD20899USA
D. Capacci
Affiliation:
Physics Dept. & Istituto Nazionale di Fisica per la Materia, viale B. Pichat 6/2, 40127Bologna, Italy
R. Patti
Affiliation:
Physics Dept. & Istituto Nazionale di Fisica per la Materia, viale B. Pichat 6/2, 40127Bologna, Italy
G. Pozzi
Affiliation:
Physics Dept. & Istituto Nazionale di Fisica per la Materia, viale B. Pichat 6/2, 40127Bologna, Italy
K. Harada
Affiliation:
Advanced Research Laboratory, Hitachi Ltd., Hatoyama-machi, Saitama-ken 350-03, Japan
H. Kasai
Affiliation:
Advanced Research Laboratory, Hitachi Ltd., Hatoyama-machi, Saitama-ken 350-03, Japan
T. Matsuda
Affiliation:
Advanced Research Laboratory, Hitachi Ltd., Hatoyama-machi, Saitama-ken 350-03, Japan
A. Tonomura
Affiliation:
Advanced Research Laboratory, Hitachi Ltd., Hatoyama-machi, Saitama-ken 350-03, Japan
Get access

Extract

In our previous papers on the same topic we have shown how the finite thickness of the specimen influences the magnetic field distribution associated to a single superconducting vortex. Fortunately, Clem found an approximate, but analytical, solution for this problem predicting that the field lines are bent within the specimen and fan out near the surfaces, giving an external field topography broader than the bulk one. This is shown in Figure 1 (a) which reports the projected phase maps of the magnetic field, i.e., the phase shift experienced by a coherent electron plane wave in an ideal experiment where the beam direction is parallel to the specimen surface and the apparent infinite thickness of the specimen is overlooked. The specimen thickness has been taken equal to 2 λL, the bulk London penetration depth. Figure 1 (b) shows the trends of the z-component of the magnetic field calculated up to a distance from the core of 5 λL at the film surface (lower curve), at the film center (intermediate curve) and, for reference, the bulk Clem model (upper curve).

Type
Recent Developments in Microscopy for Studying Electronic and Magnetic Materials
Copyright
Copyright © Microscopy Society of America 1997

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Bonevich, J.E.et al., Proc. Ann. MSA Meeting 54 (1996) 724.Google Scholar
2.Bonevich, J.E.et al., submitted to Phys. Rev. B (1997).Google Scholar
3.Clem, J.R., in Inhomogeneous Superconductors-1979(Berkeley Springs, WV), Gubser, D.U.et al., AIP Conf. Proc. No. 58 New York:AIP (1979) 245.Google Scholar
4.Hasegawa, S.et al., Phys. Rev. B 43 (1991) 10.Google Scholar
5.Bonevich, J.E.et al., Phys. Rev. B 50 (1994) 567.10.1103/PhysRevB.50.567CrossRefGoogle Scholar
6.Migliori, A., Pozzi, G.and Tonomura, A., Ultramicroscopy 49 (1993) 87.10.1016/0304-3991(93)90215-JCrossRefGoogle Scholar
7.Tonomura, A., Electron Holography, Berlin:Springer (1993).10.1007/978-3-662-13913-4CrossRefGoogle Scholar