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On the Contrast and Resolution of Secondary and Backscattered Electron Images in a FE-SEM

Published online by Cambridge University Press:  31 July 2003

Raynald Gauvin1 ,
Paula Horny  and
Eric Lifshin
Raynald Gauvin1
Affiliation:
Department Metals and Materials Engineering, McGill University, Montréal, Québec, Canada, H3A 2B2
Paula Horny
Affiliation:
Department Metals and Materials Engineering, McGill University, Montréal, Québec, Canada, H3A 2B2
Eric Lifshin
Affiliation:
Albany Institute for Materials, CESTM, 251 Fuller Road, Albany, NY, 12301, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 970 - 971
Copyright
Copyright © Microscopy Society of America 2003