Hostname: page-component-78c5997874-ndw9j Total loading time: 0 Render date: 2024-11-02T18:55:51.682Z Has data issue: false hasContentIssue false
  • English
  • Français

Off-Axis Electron Holography for the Quantitative Study of Magnetic Properties of Nanostructures: From the Single Nanomagnet to the Complex Device

Published online by Cambridge University Press:  23 September 2015

C. Gatel ,
A. Masseboeuf ,
E. Snoeck ,
F. Bonnilla ,
T. Blon ,
L.-M. Lacroix ,
A. Meffre ,
J.F. Einsle ,
R.M. Bowman  and
M.A. Bashir
...Show all authors
C. Gatel
Affiliation:
CEMES-CNRS/University of Toulouse, Toulouse, France
A. Masseboeuf
Affiliation:
CEMES-CNRS/University of Toulouse, Toulouse, France
E. Snoeck
Affiliation:
CEMES-CNRS/University of Toulouse, Toulouse, France
F. Bonnilla
Affiliation:
Laboratoire de Physique et Chimie des Nano-objets (LPCNO), INSA, Toulouse, France
T. Blon
Affiliation:
Laboratoire de Physique et Chimie des Nano-objets (LPCNO), INSA, Toulouse, France
L.-M. Lacroix
Affiliation:
Laboratoire de Physique et Chimie des Nano-objets (LPCNO), INSA, Toulouse, France
A. Meffre
Affiliation:
Laboratoire de Physique et Chimie des Nano-objets (LPCNO), INSA, Toulouse, France
J.F. Einsle
Affiliation:
Centre for Nanostructured Media, School of Mathematics and Physics, Queen's University Belfast, UK
R.M. Bowman
Affiliation:
Centre for Nanostructured Media, School of Mathematics and Physics, Queen's University Belfast, UK
M.A. Bashir
Affiliation:
Seagate Technology, 1 Disc Drive, Springtown, UK
M. Gubbins
Affiliation:
Seagate Technology, 1 Disc Drive, Springtown, UK

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 2147 - 2148
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Lacroix, L.-M., et al, J. Am. Chem. Soc 131 (2009). p. 549.CrossRefGoogle Scholar
[2] Snoeck, E., et al, Nano Lett 8 (2008). p. 4293.Google Scholar
[3] Lacroix, L.-M., et al, Nano Lett 12 (2012). p. 3245.CrossRefGoogle Scholar
[4] Rave, W., et al, J. Mag. Mag. Mat 190 (1998). p. 332.Google Scholar
[5] Einsle, J.F., et al, NanoResearch, in press (DOI 10.1007/s12274-014-0610-0).Google Scholar
[6] The authors acknowledge the European Union under the Seventh Framework Programme under a contract for an Integrated Infrastructure Initiative Reference 312483-ESTEEM2 and the French National Research Agency under the "Investissement d'Avenir" program reference No. ANR-10-EQPX-38-01". This work is supported by the French national project EMMA (ANR12 BS10 013 01).Google Scholar