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Off-axis chromatic scanning confocal electron microscopy for inelastic imaging with atomic resolution

Published online by Cambridge University Press:  23 September 2015

Changlin Zheng ,
Ye Zhu ,
Sorin Lazar  and
Joanne Etheridge

Abstract

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Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 2175 - 2176
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Urban, K. W., Mayer, J., Jinschek, J. R., Neish, M. J., Lugg, N. R. & Allen, L. J., Phys. Rev. Lett 110 (2013). p. 185507.CrossRefGoogle Scholar
[2] Zheng, C.L., Zhu, Y., Lazar, S. & Etheridge, J., Phys. Rev. Lett. 112 (2014). p. 166101.CrossRefGoogle Scholar
[3] Wilson, T. & Sheppard, C., Theory and practice of scanning optical microscopy. Academic Press,London; Orlando, 1984.Google Scholar
[4] Zheng, C.L., et al, in preparation..Google Scholar
[5] CESCOR and CETCOR by CEOS GmbH..Google Scholar
[6] Funding is acknowledged from the Australian Research Council Grants DP110104734 and LE0454166..Google Scholar