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Observing a p-n Junction in a Reverse-Biased GaP Light-Emitting Diode by Combining Electron Holography and Focused-Ion-Beam Milling

Published online by Cambridge University Press:  21 July 2003

Z. Wang ,
K. Sasaki ,
T. Hirayama ,
Y. Yabuuchi  and
H. Saka
Z. Wang
Affiliation:
Japan Fine Ceramics Center (JFCC), Nagoya, 456-8587 Japan
K. Sasaki
Affiliation:
Department of Quantum Engineering, Nagoya University, Nagoya, 464-8603 Japan
T. Hirayama
Affiliation:
Japan Fine Ceramics Center (JFCC), Nagoya, 456-8587 Japan
Y. Yabuuchi
Affiliation:
Matsushita Techno-research, Inc., Osaka, 570-8501 Japan
H. Saka
Affiliation:
Department of Quantum Engineering, Nagoya University, Nagoya, 464-8603 Japan

Abstract

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Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 772 - 773
Copyright
Copyright © Microscopy Society of America 2003