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Observation of Moiré-like Fringes in HAADF-STEM Images of Heterostructures of Two-dimensional Materials
Published online by Cambridge University Press: 25 July 2016
Abstract
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- Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 382 - 383
- Copyright
- © Microscopy Society of America 2016
References
References:
[1]
Williams, DB & Carter, CB
“Transmission Electron Microscopy: A Textbook for Materials Science (2nd Edition)”. (Springer, New York
(2009).CrossRefGoogle Scholar
[2] The authors gratefully acknowledge Dr. Joon Sue Lee and Prof. Nitin Samarth for providing the samples studied, as well as funding provided by C-SPIN, one of six centers of STARnet, a Semiconductor Research Corporation program, sponsored by MARCO and DARPA.Google Scholar
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