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Observation of Magnetic Multilayers by Electron Holography

Published online by Cambridge University Press:  22 January 2004

T. Tanji ,
S. Hasebe ,
Y. Nakagami ,
K. Yamamoto  and
M. Ichihashi
T. Tanji
Affiliation:
Department of Electronics, Nagoya University, Nagoya 464-8603, Japan
S. Hasebe
Affiliation:
Department of Electronics, Nagoya University, Nagoya 464-8603, Japan
Y. Nakagami
Affiliation:
Department of Electronics, Nagoya University, Nagoya 464-8603, Japan
K. Yamamoto
Affiliation:
Japan Science and Technology Corporation, c/o Japan Fine Ceramics Center, Nagoya 465-8587, Japan
M. Ichihashi
Affiliation:
Center for Integrated Research in Science and Engineering, Nagoya University, Nagoya 464-8603, Japan
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Abstract

Magnetic structures of Co/Cu multilayers in cross section are observed by two kinds of electron holography: a Fourier method and a phase-shifting method, which is introduced briefly. The Fourier method can easily reconstruct wave functions and is applied to many specimens, whereas the phase-shifting method requires longer time for processing, but has a higher spatial resolution that permits us to discuss fine structures. Magnetization vectors in Co layers aligning parallel and separating into two blocks with antiparallel alignment are observed. Magnetic blurring on the boundary between Co and Cu in the reconstructed phase images is larger than the estimated atomic roughness.

Keywords

multilayerelectron holographyphase-shifting methodCo/Cu
Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue 1 , February 2004 , pp. 146 - 152
Copyright
© 2004 Microscopy Society of America

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References

REFERENCES

Baibich, M.N., Broto, J.M., Fert, A., Nguyen Van Dau, F., Petroff, F., Etienne, P., Creuzet, G., Friederich, A., & Chazelas, J. (1988). Giant magnetoresistance of (001)Fe/(001)Cr magnetic superlattices. Phys Rev Lett 61, 2472–2475.Google Scholar
Dorner, C., Haidl, M., & Hoffmann, H. (1993). Giant magnetoresistance of Co/Cu multilayers with and without Fe buffer layers. J Appl Phys 74, 5886–5888.Google Scholar
Doyle, P.A. & Turner, P.S. (1968). Relativistic Hartree-Fock x-ray and electron scattering factors. Acta Cryst A 24, 390–397.Google Scholar
Dunin-Borkowski, R.E. (2000). The development of Fresnel contrast analysis, and the interpretation of mean inner potential profiles at interfaces. Ultramicroscopy 83, 193–216.Google Scholar
Hirayama, T., Ru, Q., Tanji, T., & Tonomura, A. (1993). Observation of magnetic-domain states of barium ferrite particles by electron holography. Appl Phys Lett 63, 418–420.Google Scholar
Marrows, C.H., Hickey, B.J., Herrmann, M., McVitie, S., Chapman, J.N., Ormston, M., Petford-Long, A.K., Hase, T.P.A., & Tanner, B.K. (2000). Damage caused to interlayer coupling of magnetic multilayers by residual gases. Phys Rev 61, 4131–4140.Google Scholar
Orchowski, A., Rau, W.D., & Lichte, H. (1995). Electron holography surmounts resolution limit of electron microscopy. Phys Rev Lett 74, 399–402.Google Scholar
Parkin, S.S.P., More, N., & Roche, K. (1990). Oscillations in exchange coupling and magnetoresistance in metallic superlattice structures: Co/Ru, Co/Cr, and Fe/Cr. Phys Rev Lett 64, 2304–2307.Google Scholar
Ru, Q., Endo, J., Tanji, T., & Tonomura, A. (1991). Phase-shifting electron holography by beam tilting. Appl Phys Lett 59, 2372–2374.Google Scholar
Tanji, T., Hasebe, S., & Suzuki, T. (2002). Holographic observation of magnetic fine-structures in new magnetic materials. Microsc Microanal 8(Suppl. 2), 30–31.Google Scholar
Tanji, T., Urata, K., Ishizuka, K., Ru, Q., & Tonomura, A. (1993). Observation of atomic surface potential by electron holography. Ultramicroscopy 49, 259–264.Google Scholar
Yamamoto, K., Kawajiri, I., Tanji, T., Hibino, M., & Hirayama, T. (2000). High precision phase-shifting electron holography. J Electron Microsc 49, 31–39.Google Scholar
Zweck, J., Zimmermann, T., & Schuhrke, T. (1997). TEM observation and evaluation of magnetic structures in Co/Cu multilayers. Ultramicroscopy 67, 153–162.Google Scholar