Hostname: page-component-78c5997874-m6dg7 Total loading time: 0 Render date: 2024-11-03T04:59:35.022Z Has data issue: false hasContentIssue false
  • English
  • Français

Observation of Magnetic Film Using Magnetic Force Microscope (MFM) in Ultra-High Vacuum (UHV)

Published online by Cambridge University Press:  02 July 2020

K. Suzuki ,
S. Kitamura  and
C. B. Mooney
K. Suzuki
Affiliation:
JEOL Ltd. , Tokyo, Japan
S. Kitamura
Affiliation:
JEOL Ltd. , Tokyo, Japan
C. B. Mooney
Affiliation:
JEOL US A Inc. , MA, 01960
Get access

Abstract

In recent years, the magnetic force microscope (MFM) has been used not only for the evaluation of magnetic media but also for the measurement of magnetic characteristics of quantum dots as well as in various fields, because the MFM can visualize magnetic field on the sample surface with the high resolution. The MFM observation in ultra-high vacuum (UHV) requires to reduce the adsorption layer on the sample surface for high resolution observation. The slope detection mode using the variation of vibrating cantilever is basically unstable in UHV due to the increase in the Q factor of the cantilever. Accordingly it has been used for the MFM observation in air. On the other hand, the FM detection technique offers a very high sensitivity because of the high Q factor.

This repot describes the MFM technique to take a magnetic image steadily in UHV. We observed the surface of a magnetic material with MFM technique in UHV, and compared the slope detection technique, the phase detection technique using phase variation of cantilever vibration, and the FM detection technique.

Type
Can Scanning Probe Microscopes Do Microanalysis? (Organized by I. Holl Musselman)
Information
Microscopy and Microanalysis , Volume 7 , Issue S2: Proceedings: Microscopy & Microanalysis 2001, Microscopy Society of America 59th Annual Meeting, Microbeam Analysis Society 35th Annual Meeting, Long Beach, California August 5-9, 2001 , August 2001 , pp. 866 - 867
Copyright
Copyright © Microscopy Society of America 2001

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

references

1.Ailbrecht, T. R., Grutter, P., Home, D., and Ruger, D.J. Appl. Phys. 69(1991) 668CrossRefGoogle Scholar