Hostname: page-component-586b7cd67f-t8hqh Total loading time: 0 Render date: 2024-11-29T02:54:54.115Z Has data issue: false hasContentIssue false

Observation of Lithium fluorescence X-ray utilizing Superconducting-Tunnel-Junction Array X-ray detector toward in situ mapping analyses of precipitated metal lithium in sold electrolytes of Li-ion batteries

Published online by Cambridge University Press:  01 August 2018

Masahiro Ukibe
Affiliation:
Nanoelectronics Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1, Umezono, Tsukuba, Ibaraki, Japan
Go Fujii
Affiliation:
Nanoelectronics Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1, Umezono, Tsukuba, Ibaraki, Japan
Shigetomo Shiki
Affiliation:
Nanoelectronics Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1, Umezono, Tsukuba, Ibaraki, Japan
Masataka Ohkubo
Affiliation:
Nanoelectronics Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1, Umezono, Tsukuba, Ibaraki, Japan

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Copyright
© Microscopy Society of America 2018 

References

[1] Michael, J R, Joy, D C Griffin, B J Microsc. Microanal. 15(Suppl. S2 2009 660.Google Scholar
[2] Wuhrer, R Moran, K IOP Conf. Ser.: Mater. Sci. Eng. 109 2016 012019.Google Scholar
[3] Richard, B. Firestone. Table of Isotopes, 8th edition volume 2, Edited by Virginia S. Shirley, with assistant editors Coral M. Baglin, S. Y. Frank Chu and Jean Zipkin. New York: John Wiley & Sons, Inc 1996.Google Scholar
[4] Friedrich, S., Harris, J., Warburton, W. K., Carpenter, M. H., Hall, J. A. Cantor, R. J. Low. Temp. Phys. 176 2014 553.Google Scholar
[5] Ukibe, M., Fujii, G., Shiki, S., Kitajima, Y. Ohkubo, M. J. Low. Temp. Phys. 184 2016 200.Google Scholar
[6] Fujii, G., Ukibe, M., Shiki, S. Ohkubo, M. X-ray spec 46(2017), 325.Google Scholar
[7] Hovington, O., Timoshevskii, V., Burgness, S., Demers, H., Statham, P., Gauvin, R. Zaghib, K. Scan 38 2016 571.Google Scholar