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Observation and Analysis of an Electrically Active Layer at the Core-Shell Interface of a GaN Nanowire by Advanced Electron Microscopy

Published online by Cambridge University Press:  04 August 2017

S. Yazdi ,
T. Kasama ,
R. Ciechonski ,
J. B. Wagner ,
R. E. Dunin-Borkowski  and
E. Ringe
S. Yazdi
Affiliation:
Department of Materials Science & Nano Engineering (MSNE), Rice University, Houston, Texas, United States
T. Kasama
Affiliation:
Center for Electron Nanoscopy, Technical University of Denmark, Lyngby, Denmark
R. Ciechonski
Affiliation:
GLO-AB, Ideon Science Park, Lund, Sweden
J. B. Wagner
Affiliation:
Center for Electron Nanoscopy, Technical University of Denmark, Lyngby, Denmark
R. E. Dunin-Borkowski
Affiliation:
Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Forschungszentrum Jülich, Jülich, Germany
E. Ringe
Affiliation:
Department of Materials Science & Nano Engineering (MSNE), Rice University, Houston, Texas, United States

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1406 - 1407
Copyright
© Microscopy Society of America 2017 

References

[1] Yazdi, S., et al, Journal of Physics: Conference Series 471 2013). p. 012041.Google Scholar
[2] Tchernycheva, M., et al, Nanoscale 7 2015). p. 11692.Google Scholar