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Non-Invasive Multi-Scale Imaging and Modelling Using X-Ray Microscopy

Published online by Cambridge University Press:  25 July 2016

Matthew Andrew ,
Renata Chica-Szot ,
Sven Liden ,
Piotr Such ,
Grzegorz Lesniak ,
Andreas Wiegmann ,
Jeff Gelb ,
Mike Marsh  and
Andy Steinbach
Matthew Andrew
Affiliation:
Carl Zeiss X-ray Microscopy, Pleasanton, CA, USA
Renata Chica-Szot
Affiliation:
INIG, National Research Institute, ul. Lubicz 25A, 31-503 Kraków, Poland
Sven Liden
Affiliation:
Math2Market, Stiftsplatz 5, 67655 Kaiserslautern, Germany
Piotr Such
Affiliation:
INIG, National Research Institute, ul. Lubicz 25A, 31-503 Kraków, Poland
Grzegorz Lesniak
Affiliation:
INIG, National Research Institute, ul. Lubicz 25A, 31-503 Kraków, Poland
Andreas Wiegmann
Affiliation:
Math2Market, Stiftsplatz 5, 67655 Kaiserslautern, Germany
Jeff Gelb
Affiliation:
Carl Zeiss X-ray Microscopy, Pleasanton, CA, USA
Mike Marsh
Affiliation:
Object Research Systems, Montreal, Canada
Andy Steinbach
Affiliation:
Carl Zeiss X-ray Microscopy, Pleasanton, CA, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 108 - 109
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Merkle, A., Lavery, L. L., Gelb, J. & Piché, N. Microsc. Microanal vol. 20, no Supplement S3, pp. 820–821, 2014.CrossRefGoogle Scholar
[2] Ringrose, P. S., Martinius, a. W. & Alvestad, J. Geol. Soc. London, Spec. Publ vol. 309, no. 1, pp. 123–134, 2008.CrossRefGoogle Scholar
[3] Linden, S., Wiegmann, A. & Hagen, H. Graph. Models vol. 82, pp. 58–66, 2015.Google Scholar