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Nickel oxide reduction studied by environmental TEM and in situ XRD

Published online by Cambridge University Press:  23 November 2012

Q. Jeangros ,
C. Hébert ,
A. Hessler-Wyser ,
T.W. Hansen ,
J.B. Wagner ,
C.D. Damsgaard  and
R.E. Dunin-Borkowski
Q. Jeangros
Affiliation:
EPFL, Lausanne, Switzerland
C. Hébert
Affiliation:
EPFL, Lausanne, Switzerland
A. Hessler-Wyser
Affiliation:
EPFL, Lausanne, Switzerland
T.W. Hansen
Affiliation:
Technical University of Denmark, Lyngby, Denmark
J.B. Wagner
Affiliation:
Technical University of Denmark, Lyngby, Denmark
C.D. Damsgaard
Affiliation:
Technical University of Denmark, Lyngby, Denmark
R.E. Dunin-Borkowski
Affiliation:
Jülich Research Centre, Jülich, Germany
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1176 - 1177
Copyright
Copyright © Microscopy Society of America 2012

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