Hostname: page-component-586b7cd67f-rdxmf Total loading time: 0 Render date: 2024-11-24T21:29:52.246Z Has data issue: false hasContentIssue false
  • English
  • Français

New Tools for Preparing Ultra-Thin TEM Samples

Published online by Cambridge University Press:  23 November 2012

B.W. Volbert ,
A. Rummel ,
K. Schock  and
S. Kleindiek
B.W. Volbert
Affiliation:
Namitec, Eindhoven, Netherlands
A. Rummel
Affiliation:
Kleindiek Nanotechnik, Reutlingen, Germany
K. Schock
Affiliation:
Kleindiek Nanotechnik, Reutlingen, Germany
S. Kleindiek
Affiliation:
Kleindiek Nanotechnik, Reutlingen, Germany
Get access

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 644 - 645
Copyright
Copyright © Microscopy Society of America 2012

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)