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New STEM/TEM Objective Lens for Atomic Resolution Lorentz Imaging

Published online by Cambridge University Press:  04 August 2017

Y. Kohno ,
S. Morishita  and
N. Shibata
Y. Kohno
Affiliation:
JEOL Ltd., 3-1-2 Musashino, Akishima, Tokyo, Japan
S. Morishita
Affiliation:
JEOL Ltd., 3-1-2 Musashino, Akishima, Tokyo, Japan
N. Shibata
Affiliation:
Institute of Engineering Innovation, The University of Tokyo, Tokyo, Japan

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 456 - 457
Copyright
© Microscopy Society of America 2017 

References

[1] Nagai, T., et al, Microscopy 64(S1 2015 i112. doi: 10.1093/jmicro/dfr275.Google Scholar
[2] Shirota, K., et al, J. Electron Microsc. 25 1976). p. 303.Google Scholar
[3] Takahashi, Y., et al, Microscopy and Microanalysis 21(S3 2015). p. 1865.Google Scholar
[4] Sawada, H., et al, J. Electron Microsc. 58 2009). p. 341.Google Scholar
[5] This development was supported by SENTAN, JST..Google Scholar