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A new statistical approach for generating meaningful particle size distributions from aberration corrected STEM-HAADF images of supported metal catalysts

Published online by Cambridge University Press:  23 November 2012

Q. He ,
C.J. Kiely ,
S. Freakley ,
J.K. Edwards  and
G. Hutchings
Q. He
Affiliation:
Materials Science and Engineering, Lehigh University, Bethlehem, PA
C.J. Kiely
Affiliation:
Materials Science and Engineering, Lehigh University, Bethlehem, PA
S. Freakley
Affiliation:
Cardiff University, Cardiff, Wales, United Kingdom
J.K. Edwards
Affiliation:
Cardiff University, Cardiff, Wales, United Kingdom
G. Hutchings
Affiliation:
Cardiff University, Cardiff, Wales, United Kingdom
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 376 - 377
Copyright
Copyright © Microscopy Society of America 2012

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