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A New SEM Column Combining Ultra-High Resolution and Flexible Scanning

Published online by Cambridge University Press:  04 August 2017

Petr Sytaf ,
Jaroslav Jiruse  and
Adam Zavodny
Petr Sytaf
Affiliation:
TESCAN Brno s.r.o., Brno, Czech Republic
Jaroslav Jiruse
Affiliation:
TESCAN Brno s.r.o., Brno, Czech Republic
Adam Zavodny
Affiliation:
TESCAN Brno s.r.o., Brno, Czech Republic

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 38 - 39
Copyright
© Microscopy Society of America 2017 

References

[1] Wide field optics description at www.tescan.com.Google Scholar
[2] Jiruse, J, Havelka, M & Polster, J Microsc. Microanal 22(Suppl 3 2016). p. 578–579.Google Scholar