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New Results with High Quantum Efficiency Silicon Drift Detectors

Published online by Cambridge University Press:  08 April 2017

A Niculae ,
L Andricek ,
M Bornschlegl ,
R Eckhardt ,
J Herrmann ,
O Jartischin ,
S Jeschke ,
P Lechner ,
L Mungenast  and
B Schweinfest
...Show all authors
A Niculae
Affiliation:
PNDetector GmbH, Germany
L Andricek
Affiliation:
Max Planck Institut Halbleiterlabor, Germany
M Bornschlegl
Affiliation:
PNDetector GmbH, Germany
R Eckhardt
Affiliation:
PNSensor GmbH, Germany
J Herrmann
Affiliation:
PNDetector GmbH, Germany
O Jartischin
Affiliation:
PNDetector GmbH, Germany
S Jeschke
Affiliation:
PNSensor GmbH, Germany
P Lechner
Affiliation:
PNSensor GmbH, Germany
L Mungenast
Affiliation:
PNSensor GmbH, Germany
B Schweinfest
Affiliation:
PNSensor GmbH, Germany
H Soltau
Affiliation:
PNSensor GmbH, Germany
L Strüder
Affiliation:
Max Planck Institut Halbleiterlabor, Germany

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 1204 - 1205
Copyright
Copyright © Microscopy Society of America 2011