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A New Parametrization of Mott Scattering Cross Section for Monte Carlo Simulation

Published online by Cambridge University Press:  02 July 2020

Hendrix Demers  and
Raynald Gauvin
Hendrix Demers
Affiliation:
Département de génie mécanique, Université de Sherbrooke, Sherbrooke, Québec, Canada, J1K 2R1
Raynald Gauvin
Affiliation:
Département de génie mécanique, Université de Sherbrooke, Sherbrooke, Québec, Canada, J1K 2R1
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Extract

In the recent years the Monte-Carlo simulation has been used successfully to exploit and understand fully the capabilities of electron microscopes. In this paper, we propose a new parametrization of Mott scattering cross-section for the calculation of the total cross-section as well as the polar angle of collision. This parametrization gives better results than Rutherford cross-section for Monte Carlo simulation at low beam energy without the numerous data files needed to use the exact Mott cross-section.

The calculation of elastic scattering cross-section can be performed with the Rutherford equation using the screening parameter, δ, the energy of the incident electron, and the electron wavelength, differential cross-section is given by:

Type
X-Ray Microanalysis of Rough Surfaces
Information
Microscopy and Microanalysis , Volume 6 , Issue S2: Proceedings: Microscopy & Microanalysis 2000, Microscopy Society of America 58th Annual Meeting, Microbeam Analysis Society 34th Annual Meeting, Microscopical Society of Canada/Societe de Microscopie de Canada 27th Annual Meeting, Philadelphia, Pennsylvania August 13-17, 2000 , August 2000 , pp. 926 - 927
Copyright
Copyright © Microscopy Society of America

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References

References:

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