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A New Method to Fabricate 3D Electron Tomography Sample Using FIB Technique

Published online by Cambridge University Press:  08 April 2017

X Wang ,
R Lockwood ,
D Vick ,
A Meldrum  and
M Malac
X Wang
Affiliation:
University of Alberta, Canada
R Lockwood
Affiliation:
University of Alberta, Canada
D Vick
Affiliation:
National Institute for Nanotechnology, Canada
A Meldrum
Affiliation:
University of Alberta, Canada
M Malac
Affiliation:
National Institute for Nanotechnology, Canada

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 690 - 691
Copyright
Copyright © Microscopy Society of America 2011