Hostname: page-component-cd9895bd7-gbm5v Total loading time: 0 Render date: 2024-12-25T18:44:59.692Z Has data issue: false hasContentIssue false
  • English
  • Français

New Insights in Materials Characterization – Spectral Computed Tomography

Published online by Cambridge University Press:  22 July 2022

Wesley De Boever ,
Denis Van Loo ,
Marek Dosbaba  and
Marijn Boone
Wesley De Boever*
Affiliation:
TESCAN, Belgium
Denis Van Loo
Affiliation:
TESCAN, Belgium
Marek Dosbaba
Affiliation:
TESCAN, Belgium
Marijn Boone
Affiliation:
TESCAN, Belgium
*
*Corresponding author: [email protected]

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Advanced 3D Imaging and Analysis Methods for New Opportunities in Material Science
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 282 - 283
Check for updates
Copyright
Copyright © Microscopy Society of America 2022