Hostname: page-component-586b7cd67f-gb8f7 Total loading time: 0 Render date: 2024-12-04T19:28:35.636Z Has data issue: false hasContentIssue false
  • English
  • Français

New FIB Fold-Out Method for TEM Cross-Section Sample Preparation

Published online by Cambridge University Press:  03 August 2008

HC Floresca ,
J Jeon  and
MJ Kim
HC Floresca
Affiliation:
University of Texas Dallas
J Jeon
Affiliation:
University of Texas Dallas
MJ Kim
Affiliation:
University of Texas Dallas
Get access

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 1006 - 1007
Copyright
© 2008 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)