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A New Electron Microscope with an Easy Operation System for Nano Analysis

Published online by Cambridge University Press:  09 April 2017

S Kawai ,
M Matsushita ,
K Tanaka ,
T Iwama ,
N Endo ,
T Kuba ,
Y Ohkura  and
Y Kondo
S Kawai
Affiliation:
JEOL Ltd, Japan
M Matsushita
Affiliation:
JEOL Ltd, Japan
K Tanaka
Affiliation:
JEOL Ltd, Japan
T Iwama
Affiliation:
JEOL Ltd, Japan
N Endo
Affiliation:
JEOL Ltd, Japan
T Kuba
Affiliation:
JEOL Ltd, Japan
Y Ohkura
Affiliation:
JEOL Ltd, Japan
Y Kondo
Affiliation:
JEOL Ltd, Japan

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 1198 - 1199
Copyright
Copyright © Microscopy Society of America 2011