Hostname: page-component-586b7cd67f-dsjbd Total loading time: 0 Render date: 2024-11-24T13:53:40.270Z Has data issue: false hasContentIssue false
  • English
  • Français

New Data Analysis Tools for X-ray Photoelectron Spectroscopy (XPS) and Spectroscopic Ellipsometry (SE): Uniqueness Plots and Width Functions in XPS, and Distance, Principal Component, and Cluster Analyses in SE

Published online by Cambridge University Press:  25 July 2016

Matthew R. Linford ,
Bhupinder Singh ,
Daniel Velázquez ,
Jeff Terry ,
Jacob D. Bagley ,
Dennis H. Tolley ,
Anubhav Diwan ,
Varun Jain  and
Alberto Herrera-Gomez
Matthew R. Linford
Affiliation:
Departments of Chemistry and Biochemistry and
Bhupinder Singh
Affiliation:
Departments of Chemistry and Biochemistry and
Daniel Velázquez
Affiliation:
Statistics, Brigham Young University, UT, USA
Jeff Terry
Affiliation:
Statistics, Brigham Young University, UT, USA
Jacob D. Bagley
Affiliation:
Departments of Chemistry and Biochemistry and
Dennis H. Tolley
Affiliation:
CINVESTAV-Unidad Queretaro, Queretaro, Mexico
Anubhav Diwan
Affiliation:
Departments of Chemistry and Biochemistry and
Varun Jain
Affiliation:
Departments of Chemistry and Biochemistry and
Alberto Herrera-Gomez
Affiliation:
CINVESTAV-Unidad Queretaro, Queretaro, Mexico

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 344 - 345
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Singh, B, Diwan, A, Jain, V, Herrera-Gomez, A, Terry, J & Linford, MR Submitted to Applied Surface Science.Google Scholar
[2] Singh, B, Velázquez, D, Terry, J & Linford, MR J. Electron Spectrosc 197 (2014) 56–63.CrossRefGoogle Scholar
[3] Singh, B, Velázquez, D, Terry, J & Linford, MR J. Electron Spectrosc 197 (2014) 112–117.CrossRefGoogle Scholar
[4] Bagley, JD, Tolley, DH & Linford, MR Surface and Interface Analysis (2016), DOI: 10.1002/sia.5938.CrossRefGoogle Scholar
[5] Hilfiker, JN, Singh, N, Tiwald, T, Convey, D, Smith, SM, Baker, JH & Tompkins, HG Thin Solid Films 516 (2008) 7979–7989.CrossRefGoogle Scholar
[6] Powell, CJ J. Vac. Sci. & Technol. A 21 (2003) S42–S53.CrossRefGoogle Scholar
[7] Jensen, DS, Kanyal, SS, Gupta, V, Vail, MA, Dadson, AE, Engelhard, M, Vanfleet, R, Davis, RC & Linford, MR J. Chrom. A 1257 (2012) 195–203.CrossRefGoogle Scholar
[8] Wang, H, Madaan, N, Bagley, J, Diwan, A, Liu, Y, Davis, RC, Lunt, BM, Smith, SJ & Linford, MR Thin Solid Films 569 (2014) 124–130.CrossRefGoogle Scholar