Hostname: page-component-586b7cd67f-vdxz6 Total loading time: 0 Render date: 2024-11-30T02:33:31.084Z Has data issue: false hasContentIssue false
  • English
  • Français

A New Approach to Microns-Resolution Trace Element and Mineralogy Mapping at PPM Sensitivity for Digital Rock and Geological Research

Published online by Cambridge University Press:  04 August 2017

Sylvia JY Lewis ,
SH Lau ,
Wenbing Yun ,
Benjamin Stripe ,
Alan Lyon ,
David Reynolds ,
Sharon Chen  and
Richard Ian Spink
Sylvia JY Lewis
Affiliation:
Sigray, Inc. Concord, CA USA
SH Lau
Affiliation:
Sigray, Inc. Concord, CA USA
Wenbing Yun
Affiliation:
Sigray, Inc. Concord, CA USA
Benjamin Stripe
Affiliation:
Sigray, Inc. Concord, CA USA
Alan Lyon
Affiliation:
Sigray, Inc. Concord, CA USA
David Reynolds
Affiliation:
Sigray, Inc. Concord, CA USA
Sharon Chen
Affiliation:
Sigray, Inc. Concord, CA USA
Richard Ian Spink
Affiliation:
Sigray, Inc. Concord, CA USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 2176 - 2177
Copyright
© Microscopy Society of America 2017 

References

■

[1] Pirrie, D, et al., Geology Today 2011). p. 232.Google Scholar
[2] Fogden, A, et al, SCA Proceedings 2014). p. 7.Google Scholar
[3] The authors acknowledge funding from the NSF, Division of Industrial Innovation & Partnerships for the development of x-ray mirror lens (IIP-1448727) and the NIH, National Institute of General Medicine Science for the development of the microstructured source target (GRANT11545218).Google Scholar