Hostname: page-component-cd9895bd7-gvvz8 Total loading time: 0 Render date: 2024-12-26T07:31:19.205Z Has data issue: false hasContentIssue false
  • English
  • Français

A New Approach to Infrared Microspectroscopy: Adding FT-IR to a Light Microscope

Published online by Cambridge University Press:  01 August 2002

John A. Reffner ,
Donald K. Wilks ,
Kenneth C. Schreiber  and
Robert V. Burch
John A. Reffner
Affiliation:
SensIR Technologies, Danbury CT 06810
Donald K. Wilks
Affiliation:
SensIR Technologies, Danbury CT 06810
Kenneth C. Schreiber
Affiliation:
SensIR Technologies, Danbury CT 06810
Robert V. Burch
Affiliation:
SensIR Technologies, Danbury CT 06810

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 1526 - 1527
Copyright
Copyright © Microscopy Society of America 2002