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The new aberration-corrected, cold-field emission JEOL JEM-ARM200CF STEM/TEM at the University of Illinois at Chicago

Published online by Cambridge University Press:  23 November 2012

R.F. Klie ,
A. Gulec ,
J. Liu ,
P. Phillips ,
R. Tao ,
K. Low  and
A. Nicholls
R.F. Klie
Affiliation:
Department of Physics, Univ of Illinois at Chicago, Chicago, IL
A. Gulec
Affiliation:
Department of Physics, Univ of Illinois at Chicago, Chicago, IL
J. Liu
Affiliation:
Department of Physics, Univ of Illinois at Chicago, Chicago, IL
P. Phillips
Affiliation:
Department of Physics, Univ of Illinois at Chicago, Chicago, IL
R. Tao
Affiliation:
Department of Physics, Univ of Illinois at Chicago, Chicago, IL
K. Low
Affiliation:
Department of Physics, Univ of Illinois at Chicago, Chicago, IL
A. Nicholls
Affiliation:
Department of Physics, Univ of Illinois at Chicago, Chicago, IL
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 406 - 407
Copyright
Copyright © Microscopy Society of America 2012

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